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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
杂志名称:IEEE器件和材料可靠性汇刊
简称:IEEE T DEVICE MAT RE
期刊ISSN:1530-4388
大类研究方向:工程技术
影响因子:1.583
数据库类型:SCIE
是否OA:No
出版地:UNITED STATES
年文章数:98
小类研究方向:工程技术-工程:电子与电气
审稿速度:较慢,6-12周
平均录用比例:较易

官方网站:http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298

投稿网址:http://mc.manuscriptcentral.com/tdmr

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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

英文简介

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

中文简介

IEEE设备和材料可靠性事务季刊。它提供对可靠电子设备和材料的创造至关重要的前沿信息,并在电子设备及其制造中使用的材料的可靠性方面成为跨学科交流的重点。它侧重于电子、光学、磁器件和微系统的可靠性;用于制造这些装置的材料和工艺;以及这些材料的界面和表面。

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