期刊名称搜索、人工推荐、功能齐全

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

SCIE
期刊ISSN:1530-4388
大类研究方向:工程技术
影响因子:1.583
数据库类型:SCIE
是否OA:No
出版地:UNITED STATES
年文章数:98
小类研究方向:工程技术-工程:电子与电气
审稿速度:较慢,6-12周
平均录用比例:较易

官方网站:http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298

投稿网址:http://mc.manuscriptcentral.com/tdmr

填单可快速匹配SCI/SSCI/AHCI期刊 解答审稿周期、版面费、录用率问题

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 英文简介

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 中文简介

IEEE设备和材料可靠性事务季刊。它提供对可靠电子设备和材料的创造至关重要的前沿信息,并在电子设备及其制造中使用的材料的可靠性方面成为跨学科交流的重点。它侧重于电子、光学、磁器件和微系统的可靠性;用于制造这些装置的材料和工艺;以及这些材料的界面和表面。

  • 常见问题答疑
  • 同类领域期刊推荐

SCI期刊分类

Academic journals

期刊之家 期刊纠错 快速选刊

Copyright © 2010 期刊之家(http://www.qikanzj.com/).版权所有
SCI SSCI分区查询